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  Fachwissen | Helmut Fis...  
Bestimmung von Schadstoffen in kleinsten Konzentrationen – RoHS
Non-destructive measurement of CDP coatings inside hollow car body parts
  Application Notes: Galv...  
Bestimmung von Schadstoffen in kleinsten Konzentrationen – RoHS
Non-destructive measurement of CDP coatings inside hollow car body parts
  Application Notes: Auto...  
Bestimmung von Schadstoffen in kleinsten Konzentrationen – RoHS
Non-destructive measurement of CDP coatings inside hollow car body parts
  Application Notes | Hel...  
Bestimmung von Schadstoffen in kleinsten Konzentrationen – RoHS
Non-destructive measurement of CDP coatings inside hollow car body parts
  Taktile Messverfahren |...  
Bestimmung von Schadstoffen in kleinsten Konzentrationen – RoHS
Non-destructive measurement of CDP coatings inside hollow car body parts
Non-destructive measurement of CDP coatings inside hollow car body parts
  Sitemap | Helmut Fische...  
Bestimmung von Schadstoffen in kleinsten Konzentrationen – RoHS
Non-destructive measurement of CDP coatings inside hollow car body parts
Non-destructive measurement of CDP coatings inside hollow car body parts
Measurement of Thick Coatings on Pipelines
  Application Notes: Best...  
Ein lokaler Ansprechpartner von Fischer berät Sie gerne bei der Auswahl des geeigneten Röntgenfluoreszenz-Gerätes für die Vermessung von kleinsten Schadstoff-Konzentrationen: X-RAY XDV®-SDD, XAN® 150 mit SDD oder XDAL® mit PIN-Detektor.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
  Application Notes: Schi...  
Damit können die Schichtdicken auf kleinsten Schneidezähnen von kostspieligen Werkzeugen genau gemessen werden. Zudem kann mit demselben Messgerät die metallische Zusammensetzung der Werkzeuge bestimmt werden, um z. B. das Herauslösen von Kobalt beim chemischen Entfernen alter Beschichtungen vor einem Nachbeschichten zu bestimmen.
The instrument’s specialisation for this purpose means that layer thickness can be accurately measured on even the finest cutting edges of very high-end tools. Furthermore, using the same instrument, it is possible to determine the base tools’ precise metallic composition – e.g. to determine Cobalt leaching when an old coating is chemically removed before a new coating is applied.
  Industrielle Messtechni...  
Bestimmung von Schadstoffen in kleinsten Konzentrationen – RoHS
Determination of Harmful Substances in Very Small Concentrations – RoHS
Determination of Harmful Substances in Very Small Concentrations – RoHS
Determination of Harmful Substances in Very Small Concentrations – RoHS
Determination of Harmful Substances in Very Small Concentrations – RoHS
Determination of Harmful Substances in Very Small Concentrations – RoHS
Determination of Harmful Substances in Very Small Concentrations – RoHS
Determination of Harmful Substances in Very Small Concentrations – RoHS
Determination of Harmful Substances in Very Small Concentrations – RoHS
Determination of Harmful Substances in Very Small Concentrations – RoHS
Determination of Harmful Substances in Very Small Concentrations – RoHS
Determination of Harmful Substances in Very Small Concentrations – RoHS
  Neues aus dem Hause Hel...  
Messungen auf kleinsten Strukturen, wie Stanz- oder Vollbändern
Measurements on tiny structures like stamped or full strips
Measurements on tiny structures like stamped or full strips
Measurements on tiny structures like stamped or full strips
Measurements on tiny structures like stamped or full strips
Measurements on tiny structures like stamped or full strips
Measurements on tiny structures like stamped or full strips
Measurements on tiny structures like stamped or full strips
Measurements on tiny structures like stamped or full strips
Measurements on tiny structures like stamped or full strips
Damgalı veya tam şeritler gibi küçük yapılarda ölçüm
Measurements on tiny structures like stamped or full strips
  Neues aus dem Hause Hel...  
Die Bilderkennung ermöglicht in FISCHERSCOPE® X-RAY-Geräten eine sichere Positionierung auch bei kleinsten Strukturen.
With the new pattern recognition feature, all FISCHERSCOPE® X-RAY instruments with programmble XY tables are capable to position samples safely even in difficult conditions.
With the new pattern recognition feature, all FISCHERSCOPE® X-RAY instruments with programmble XY tables are capable to position samples safely even in difficult conditions.
With the new pattern recognition feature, all FISCHERSCOPE® X-RAY instruments with programmble XY tables are capable to position samples safely even in difficult conditions.
With the new pattern recognition feature, all FISCHERSCOPE® X-RAY instruments with programmble XY tables are capable to position samples safely even in difficult conditions.
With the new pattern recognition feature, all FISCHERSCOPE® X-RAY instruments with programmble XY tables are capable to position samples safely even in difficult conditions.
With the new pattern recognition feature, all FISCHERSCOPE® X-RAY instruments with programmble XY tables are capable to position samples safely even in difficult conditions.
With the new pattern recognition feature, all FISCHERSCOPE® X-RAY instruments with programmble XY tables are capable to position samples safely even in difficult conditions.
With the new pattern recognition feature, all FISCHERSCOPE® X-RAY instruments with programmble XY tables are capable to position samples safely even in difficult conditions.
With the new pattern recognition feature, all FISCHERSCOPE® X-RAY instruments with programmble XY tables are capable to position samples safely even in difficult conditions.
With the new pattern recognition feature, all FISCHERSCOPE® X-RAY instruments with programmble XY tables are capable to position samples safely even in difficult conditions.
With the new pattern recognition feature, all FISCHERSCOPE® X-RAY instruments with programmble XY tables are capable to position samples safely even in difficult conditions.
  Lösungen: RoHS/Spuren- ...  
Ein lokaler Ansprechpartner von Fischer berät Sie gerne bei der Auswahl des geeigneten Röntgenfluoreszenz-Gerätes für die Vermessung von kleinsten Schadstoff-Konzentrationen: X-RAY XDV®-SDD, XAN® 150 mit SDD oder XDAL® mit PIN-Detektor.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
  Industrielle Messtechni...  
Ein lokaler Ansprechpartner von Fischer berät Sie gerne bei der Auswahl des geeigneten Röntgenfluoreszenz-Gerätes für die Vermessung von kleinsten Schadstoff-Konzentrationen: X-RAY XDV®-SDD, XAN® 150 mit SDD oder XDAL® mit PIN-Detektor.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
  Messinstrumente und Ana...  
Die Gerätereihe XDV-µ ist für die präzise Schichtdickenmessung und Materialanalyse auf kleinsten Strukturen ausgelegt. Alle Geräte verfügen über eine Polykapillaroptik, die die Röntgenstrahlung bündelt.
The XDV-μ series is designed for precise coating thickness measurement and material analysis on very delicate structures. All devices are equipped with polycapillary optics that focus the X-ray beam, making measuring spots (fwhm) with diameters between 10 and 60 μm possible. The high intensity of the focused radiation results in a short measuring duration. Besides the universally applicable XDV-μ, specialized devices are also available for the electronics and semiconductor industries. For example, the XDV-μ LD is optimized for measuring on printed circuit boards, while the XDV-μ Wafer is intended for use in clean rooms.
XDV-μ serisi, çok hassas yapılar üzerinde ince kaplama kalınlığı ölçümü ve malzeme analizi için tasarlanmıştır. Tüm cihazlar, 10 ila 60 μm arası çapları olan küçük alanları (fwhm) ölçebilecek, X-ışını demetini odaklayan polikapiller optiklerle donatılmıştır. Odaklanmış radyasyonun yüksek yoğunluğu, kısa bir ölçüm süresi sağlar. Üniversal olarak kullanılabilen XDV-μ modellerinin yanı sıra, elektronik ve yarı iletken endüstrileri için başka özel cihazlar da mevcuttur. Örneğin, XDV-μ LD, baskılı devre kartlarında ölçüm yapmak için optimize edilmişken, XDV-μ Wafer temiz odalarda kullanılmak üzere tasarlanmıştır.
XDV-μ sērija ir paredzēta precīzai pārklājuma biezuma mērīšanai un materiālu analīzei ļoti smalkām struktūrām. Visas ierīces ir aprīkotas ar polikapilāru optiku, kas fokusē rentgena staru, nodrošinot mērīšanas iespēju vietām (fwhm) ar 10–60 μm diametru. Fokusētā starojuma intensitāte saīsina mērīšanas laiku. Papildus universālā pielietojuma XDV-μ ir pieejamas arī specializētas ierīces elektronikas un pusvadītāju nozarēm. Piemēram, XDV-μ LD ir optimizēta iespiedshēmu plašu mērījumiem, bet XDV-μ Wafer ir paredzēta lietošanai tīrās telpās.
  Lösungen: RoHS, WEEE, E...  
Ein lokaler Ansprechpartner von Fischer berät Sie gerne bei der Auswahl des geeigneten Röntgenfluoreszenz-Gerätes für die Vermessung von kleinsten Schadstoff-Konzentrationen: X-RAY XDV®-SDD, XAN® 150 mit SDD oder XDAL® mit PIN-Detektor.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
Your local contact person for FISCHER products will be happy to assist you in selecting a suitable X-ray fluorescence instrument for measuring very small concentrations of harmful substances – FISCHERSCOPE® X-RAY XDV®-SDD, XAN® 150 with SDD detector, or XDAL® with PIN detector.
  Industrielle Messtechni...  
Damit können die Schichtdicken auf kleinsten Schneidezähnen von kostspieligen Werkzeugen genau gemessen werden. Zudem kann mit demselben Messgerät die metallische Zusammensetzung der Werkzeuge bestimmt werden, um z. B. das Herauslösen von Kobalt beim chemischen Entfernen alter Beschichtungen vor einem Nachbeschichten zu bestimmen.
The instrument’s specialisation for this purpose means that layer thickness can be accurately measured on even the finest cutting edges of very high-end tools. Furthermore, using the same instrument, it is possible to determine the base tools’ precise metallic composition – e.g. to determine Cobalt leaching when an old coating is chemically removed before a new coating is applied.
The instrument’s specialisation for this purpose means that layer thickness can be accurately measured on even the finest cutting edges of very high-end tools. Furthermore, using the same instrument, it is possible to determine the base tools’ precise metallic composition – e.g. to determine Cobalt leaching when an old coating is chemically removed before a new coating is applied.
The instrument’s specialisation for this purpose means that layer thickness can be accurately measured on even the finest cutting edges of very high-end tools. Furthermore, using the same instrument, it is possible to determine the base tools’ precise metallic composition – e.g. to determine Cobalt leaching when an old coating is chemically removed before a new coating is applied.
The instrument’s specialisation for this purpose means that layer thickness can be accurately measured on even the finest cutting edges of very high-end tools. Furthermore, using the same instrument, it is possible to determine the base tools’ precise metallic composition – e.g. to determine Cobalt leaching when an old coating is chemically removed before a new coating is applied.
The instrument’s specialisation for this purpose means that layer thickness can be accurately measured on even the finest cutting edges of very high-end tools. Furthermore, using the same instrument, it is possible to determine the base tools’ precise metallic composition – e.g. to determine Cobalt leaching when an old coating is chemically removed before a new coating is applied.
The instrument’s specialisation for this purpose means that layer thickness can be accurately measured on even the finest cutting edges of very high-end tools. Furthermore, using the same instrument, it is possible to determine the base tools’ precise metallic composition – e.g. to determine Cobalt leaching when an old coating is chemically removed before a new coating is applied.
The instrument’s specialisation for this purpose means that layer thickness can be accurately measured on even the finest cutting edges of very high-end tools. Furthermore, using the same instrument, it is possible to determine the base tools’ precise metallic composition – e.g. to determine Cobalt leaching when an old coating is chemically removed before a new coating is applied.
The instrument’s specialisation for this purpose means that layer thickness can be accurately measured on even the finest cutting edges of very high-end tools. Furthermore, using the same instrument, it is possible to determine the base tools’ precise metallic composition – e.g. to determine Cobalt leaching when an old coating is chemically removed before a new coating is applied.
The instrument’s specialisation for this purpose means that layer thickness can be accurately measured on even the finest cutting edges of very high-end tools. Furthermore, using the same instrument, it is possible to determine the base tools’ precise metallic composition – e.g. to determine Cobalt leaching when an old coating is chemically removed before a new coating is applied.
The instrument’s specialisation for this purpose means that layer thickness can be accurately measured on even the finest cutting edges of very high-end tools. Furthermore, using the same instrument, it is possible to determine the base tools’ precise metallic composition – e.g. to determine Cobalt leaching when an old coating is chemically removed before a new coating is applied.
The instrument’s specialisation for this purpose means that layer thickness can be accurately measured on even the finest cutting edges of very high-end tools. Furthermore, using the same instrument, it is possible to determine the base tools’ precise metallic composition – e.g. to determine Cobalt leaching when an old coating is chemically removed before a new coating is applied.