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Bei Au-Schichtdicken von ca. 4, 6 und 9 nm lagen die Ergebnisse der Röntgenfluoreszenz-Geräte jeweils zwischen den anderen beiden Methoden, bei Abweichungen im sub-nm Bereich. Damit ist nicht nur die geringe Streuung sondern auch die Richtigkeit der Messungen mit Röntgenfluoreszenz-Geräten bestätigt.
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For Au coating thicknesses of about 4, 6 and 9 nm, the results from the X-ray fluorescence instruments were all between the two other methods, with deviations in the sub-nm range, confirming not only the low scatter but also the trueness of measurements using X-ray fluorescence instruments. Traceability of the measurement results is ensured by using the FISCHER calibration standards developed specifically for this measuring application. The simple handling of X-ray fluorescence instruments also allows for easy scanning of a specimen to determine the homogeneity of the coating thickness, if required (see Fig. 2).
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For Au coating thicknesses of about 4, 6 and 9 nm, the results from the X-ray fluorescence instruments were all between the two other methods, with deviations in the sub-nm range, confirming not only the low scatter but also the trueness of measurements using X-ray fluorescence instruments. Traceability of the measurement results is ensured by using the FISCHER calibration standards developed specifically for this measuring application. The simple handling of X-ray fluorescence instruments also allows for easy scanning of a specimen to determine the homogeneity of the coating thickness, if required (see Fig. 2).
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For Au coating thicknesses of about 4, 6 and 9 nm, the results from the X-ray fluorescence instruments were all between the two other methods, with deviations in the sub-nm range, confirming not only the low scatter but also the trueness of measurements using X-ray fluorescence instruments. Traceability of the measurement results is ensured by using the FISCHER calibration standards developed specifically for this measuring application. The simple handling of X-ray fluorescence instruments also allows for easy scanning of a specimen to determine the homogeneity of the coating thickness, if required (see Fig. 2).
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For Au coating thicknesses of about 4, 6 and 9 nm, the results from the X-ray fluorescence instruments were all between the two other methods, with deviations in the sub-nm range, confirming not only the low scatter but also the trueness of measurements using X-ray fluorescence instruments. Traceability of the measurement results is ensured by using the FISCHER calibration standards developed specifically for this measuring application. The simple handling of X-ray fluorescence instruments also allows for easy scanning of a specimen to determine the homogeneity of the coating thickness, if required (see Fig. 2).
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For Au coating thicknesses of about 4, 6 and 9 nm, the results from the X-ray fluorescence instruments were all between the two other methods, with deviations in the sub-nm range, confirming not only the low scatter but also the trueness of measurements using X-ray fluorescence instruments. Traceability of the measurement results is ensured by using the FISCHER calibration standards developed specifically for this measuring application. The simple handling of X-ray fluorescence instruments also allows for easy scanning of a specimen to determine the homogeneity of the coating thickness, if required (see Fig. 2).
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For Au coating thicknesses of about 4, 6 and 9 nm, the results from the X-ray fluorescence instruments were all between the two other methods, with deviations in the sub-nm range, confirming not only the low scatter but also the trueness of measurements using X-ray fluorescence instruments. Traceability of the measurement results is ensured by using the FISCHER calibration standards developed specifically for this measuring application. The simple handling of X-ray fluorescence instruments also allows for easy scanning of a specimen to determine the homogeneity of the coating thickness, if required (see Fig. 2).
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For Au coating thicknesses of about 4, 6 and 9 nm, the results from the X-ray fluorescence instruments were all between the two other methods, with deviations in the sub-nm range, confirming not only the low scatter but also the trueness of measurements using X-ray fluorescence instruments. Traceability of the measurement results is ensured by using the FISCHER calibration standards developed specifically for this measuring application. The simple handling of X-ray fluorescence instruments also allows for easy scanning of a specimen to determine the homogeneity of the coating thickness, if required (see Fig. 2).
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For Au coating thicknesses of about 4, 6 and 9 nm, the results from the X-ray fluorescence instruments were all between the two other methods, with deviations in the sub-nm range, confirming not only the low scatter but also the trueness of measurements using X-ray fluorescence instruments. Traceability of the measurement results is ensured by using the FISCHER calibration standards developed specifically for this measuring application. The simple handling of X-ray fluorescence instruments also allows for easy scanning of a specimen to determine the homogeneity of the coating thickness, if required (see Fig. 2).
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For Au coating thicknesses of about 4, 6 and 9 nm, the results from the X-ray fluorescence instruments were all between the two other methods, with deviations in the sub-nm range, confirming not only the low scatter but also the trueness of measurements using X-ray fluorescence instruments. Traceability of the measurement results is ensured by using the FISCHER calibration standards developed specifically for this measuring application. The simple handling of X-ray fluorescence instruments also allows for easy scanning of a specimen to determine the homogeneity of the coating thickness, if required (see Fig. 2).
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For Au coating thicknesses of about 4, 6 and 9 nm, the results from the X-ray fluorescence instruments were all between the two other methods, with deviations in the sub-nm range, confirming not only the low scatter but also the trueness of measurements using X-ray fluorescence instruments. Traceability of the measurement results is ensured by using the FISCHER calibration standards developed specifically for this measuring application. The simple handling of X-ray fluorescence instruments also allows for easy scanning of a specimen to determine the homogeneity of the coating thickness, if required (see Fig. 2).
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For Au coating thicknesses of about 4, 6 and 9 nm, the results from the X-ray fluorescence instruments were all between the two other methods, with deviations in the sub-nm range, confirming not only the low scatter but also the trueness of measurements using X-ray fluorescence instruments. Traceability of the measurement results is ensured by using the FISCHER calibration standards developed specifically for this measuring application. The simple handling of X-ray fluorescence instruments also allows for easy scanning of a specimen to determine the homogeneity of the coating thickness, if required (see Fig. 2).
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