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Kaplama kalınlığının, elektrik iletkenliğinin veya bir malzemenin bileşiminin ölçümü farketmez - her zaman dalgalanmalar vardır. Bu nedenle, tek bir okuma gerçekliği tam olarak yansıtmaz. İstatistiksel olarak değerlendirilmesi gereken birkaç ölçüm gerektirir.
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Que l'on mesure l'épaisseur de revêtements, la conductivité ou la composition d'un matériau : il y aura toujours des fluctuations. Les appareils Fischer simplifient l’analyse statistique de ces données. Voici les grandeurs statistiques les plus importantes.
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Egal, ob Sie die Schichtdicke, die elektrische Leitfähigkeit oder die Zusammensetzung eines Materials messen - es gibt immer Schwankungen. Mit Fischer-Geräten ist die statistische Analyse dieser Daten kein Problem. Hier finden Sie eine Zusammenfassung der wichtigsten statistischen Begriffe.
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No matter whether you’re measuring layer thickness, electrical conductivity or the composition of a material – there are always fluctuations. With Fischer devices, statistical analysis of this variation is no problem. Here’s a summary of the most important statistical parameters.
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No matter whether you’re measuring layer thickness, electrical conductivity or the composition of a material – there are always fluctuations. With Fischer devices, statistical analysis of this variation is no problem. Here’s a summary of the most important statistical parameters.
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No matter whether you’re measuring layer thickness, electrical conductivity or the composition of a material – there are always fluctuations. With Fischer devices, statistical analysis of this variation is no problem. Here’s a summary of the most important statistical parameters.
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No matter whether you’re measuring layer thickness, electrical conductivity or the composition of a material – there are always fluctuations. With Fischer devices, statistical analysis of this variation is no problem. Here’s a summary of the most important statistical parameters.
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No matter whether you’re measuring layer thickness, electrical conductivity or the composition of a material – there are always fluctuations. With Fischer devices, statistical analysis of this variation is no problem. Here’s a summary of the most important statistical parameters.
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No matter whether you’re measuring layer thickness, electrical conductivity or the composition of a material – there are always fluctuations. With Fischer devices, statistical analysis of this variation is no problem. Here’s a summary of the most important statistical parameters.
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No matter whether you’re measuring layer thickness, electrical conductivity or the composition of a material – there are always fluctuations. With Fischer devices, statistical analysis of this variation is no problem. Here’s a summary of the most important statistical parameters.
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No matter whether you’re measuring layer thickness, electrical conductivity or the composition of a material – there are always fluctuations. With Fischer devices, statistical analysis of this variation is no problem. Here’s a summary of the most important statistical parameters.
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